{"id":13193,"date":"2026-02-10T12:26:38","date_gmt":"2026-02-10T11:26:38","guid":{"rendered":"https:\/\/www.encontec.de\/accredited-test-laboratory\/scanning-electron-microscopy\/"},"modified":"2026-04-15T09:35:36","modified_gmt":"2026-04-15T07:35:36","slug":"scanning-electron-microscopy","status":"publish","type":"page","link":"https:\/\/www.encontec.de\/en\/accredited-test-laboratory\/scanning-electron-microscopy\/","title":{"rendered":"Scanning electron microscopy"},"content":{"rendered":"<div id=\"pl-13193\"  class=\"panel-layout\" ><div id=\"pg-13193-0\"  class=\"panel-grid panel-has-style\" ><div class=\"header-slider panel-row-style panel-row-style-for-13193-0\" ><div id=\"pgc-13193-0-0\"  class=\"panel-grid-cell\" ><div id=\"panel-13193-0-0-0\" class=\"so-panel widget widget_sow-editor panel-first-child panel-last-child\" data-index=\"0\" ><div\n\t\t\t\n\t\t\tclass=\"so-widget-sow-editor so-widget-sow-editor-base\"\n\t\t\t\n\t\t>\n<div class=\"siteorigin-widget-tinymce textwidget\">\n\t<div id=\"metaslider-id-13195\" style=\"width: 100%;\" class=\"ml-slider-3-107-0 metaslider metaslider-flex metaslider-13195 ml-slider ms-theme-default nav-hidden\" role=\"region\" aria-label=\"Rasterelektronenmikroskopie EN\" data-height=\"965\" data-width=\"1920\">\n    <div id=\"metaslider_container_13195\">\n        <div id=\"metaslider_13195\">\n            <ul class='slides'>\n                <li style=\"display: block; width: 100%;\" class=\"slide-13197 ms-image \" aria-roledescription=\"slide\" data-date=\"2026-04-15 09:32:27\" data-filename=\"rem-1920x965-1.webp\" data-slide-type=\"image\"><img loading=\"lazy\" decoding=\"async\" src=\"https:\/\/www.encontec.de\/wp-content\/uploads\/2026\/02\/rem-1920x965-1.webp\" height=\"965\" width=\"1920\" alt=\"\" class=\"slider-13195 slide-13197 msDefaultImage\" title=\"rem-1920x965\" \/><div class=\"caption-wrap\"><div class=\"caption\"><div class=\"caption-inner\"> <div class=\"header-slider-text\"> <p class=\"slidergross\">Scanning electron microscopy (SEM) &amp; EDX analysis \u2013<\/p> <p class=\"slidernormal\">High-resolution material analysis at the nanometre scale<\/p> <\/div> <\/div><\/div><\/div><\/li>\n            <\/ul>\n        <\/div>\n        \n    <\/div>\n<\/div>\n<\/div>\n<\/div><\/div><\/div><\/div><\/div><div id=\"pg-13193-1\"  class=\"panel-grid panel-has-style\" ><div class=\"default-space-big container space-bottom-small panel-row-style panel-row-style-for-13193-1\" ><div id=\"pgc-13193-1-0\"  class=\"panel-grid-cell\" ><div id=\"panel-13193-1-0-0\" class=\"so-panel widget widget_sow-editor panel-first-child\" data-index=\"1\" ><div class=\"seo-text panel-widget-style panel-widget-style-for-13193-1-0-0\" ><div\n\t\t\t\n\t\t\tclass=\"so-widget-sow-editor so-widget-sow-editor-base\"\n\t\t\t\n\t\t>\n<div class=\"siteorigin-widget-tinymce textwidget\">\n\t<h1>Failure analysis - material characterization and quality control<\/h1>\n<p>Scanning electron microscopy (SEM) enables extremely high-resolution images of surfaces, microstructures and fracture mechanisms. In combination with energy-dispersive X-ray spectroscopy (EDX), chemical elements from atomic number 5\/6 can also be reliably determined. SEM \/EDX analysis thus provides decisive information for <strong>quality assurance, damage analysis, material development and process optimization<\/strong>. As a <strong>DIN EN ISO\/IEC 17025<\/strong> accredited testing laboratory, encontec offers independent, reproducible and industry-oriented analyses for mechanical engineering, medical technology, the food industry, electronics, automotive and many other sectors.   <\/p>\n<\/div>\n<\/div><\/div><\/div><div id=\"panel-13193-1-0-1\" class=\"so-panel widget widget_sow-editor panel-last-child\" data-index=\"2\" ><div\n\t\t\t\n\t\t\tclass=\"so-widget-sow-editor so-widget-sow-editor-base\"\n\t\t\t\n\t\t>\n<div class=\"siteorigin-widget-tinymce textwidget\">\n\t<\/div>\n<\/div><\/div><\/div><\/div><\/div><div id=\"pg-13193-2\"  class=\"panel-grid panel-has-style\" ><div class=\"anwendungen-wrap anwendungen-wrap-reverse panel-row-style panel-row-style-for-13193-2\" ><div id=\"pgc-13193-2-0\"  class=\"panel-grid-cell\" ><div id=\"panel-13193-2-0-0\" class=\"so-panel widget widget_sow-editor panel-first-child panel-last-child\" data-index=\"3\" ><div class=\"text-wrap normal-list panel-widget-style panel-widget-style-for-13193-2-0-0\" ><div\n\t\t\t\n\t\t\tclass=\"so-widget-sow-editor so-widget-sow-editor-base\"\n\t\t\t\n\t\t>\n<div class=\"siteorigin-widget-tinymce textwidget\">\n\t<div class=\"text-wrap-inner\">\n<h3 style=\"color: #ffffff;\">Our services:<\/h3>\n<ul>\n<li>High-resolution SEM imaging<\/li>\n<li>EDX element analysis (point, line, area)<\/li>\n<li>Fractography &amp; damage analysis<\/li>\n<li>Analysis of cracks, pores, inclusions, particles<\/li>\n<li>Layer and cross-sectional examinations<\/li>\n<li>CL analytics for ceramics, semiconductors, minerals<\/li>\n<\/ul>\n<p>&nbsp;<\/p>\n<p><strong>Your advantage:<\/strong> Accredited, reproducible and industry-oriented material analyses - fast, precise and reliable.<\/p>\n<p><strong>Request SEM\/EDX analysis now - <br \/>We deliver results you can rely on.<\/strong><\/p>\n<\/div>\n<p><a class=\"btn btn-anwendungen\" href=\"https:\/\/www.encontec.de\/en\/contact\/\">Your request<\/a><\/p>\n<\/div>\n<\/div><\/div><\/div><\/div><div id=\"pgc-13193-2-1\"  class=\"panel-grid-cell\" ><div id=\"panel-13193-2-1-0\" class=\"so-panel widget widget_sow-editor panel-first-child panel-last-child\" data-index=\"4\" ><div class=\"image-wrap panel-widget-style panel-widget-style-for-13193-2-1-0\" ><div\n\t\t\t\n\t\t\tclass=\"so-widget-sow-editor so-widget-sow-editor-base\"\n\t\t\t\n\t\t>\n<div class=\"siteorigin-widget-tinymce textwidget\">\n\t<p><img loading=\"lazy\" decoding=\"async\" class=\"alignnone size-full wp-image-12823\" src=\"https:\/\/www.encontec.de\/wp-content\/uploads\/2026\/02\/rem-971x520-1.webp\" alt=\"\" width=\"971\" height=\"520\" srcset=\"https:\/\/www.encontec.de\/wp-content\/uploads\/2026\/02\/rem-971x520-1.webp 971w, https:\/\/www.encontec.de\/wp-content\/uploads\/2026\/02\/rem-971x520-1-300x161.webp 300w, https:\/\/www.encontec.de\/wp-content\/uploads\/2026\/02\/rem-971x520-1-768x411.webp 768w\" sizes=\"auto, (max-width: 767px) 89vw, (max-width: 1000px) 54vw, (max-width: 1071px) 543px, 580px\" \/><\/p>\n<\/div>\n<\/div><\/div><\/div><\/div><\/div><\/div><div id=\"pg-13193-3\"  class=\"panel-grid panel-has-style\" ><div class=\"default-space container space-bottom  panel-row-style panel-row-style-for-13193-3\" ><div id=\"pgc-13193-3-0\"  class=\"panel-grid-cell\" ><div id=\"panel-13193-3-0-0\" class=\"so-panel widget widget_sow-editor panel-first-child panel-last-child\" data-index=\"5\" ><div\n\t\t\t\n\t\t\tclass=\"so-widget-sow-editor so-widget-sow-editor-base\"\n\t\t\t\n\t\t>\n<div class=\"siteorigin-widget-tinymce textwidget\">\n\t<h2>SEM &amp; EDX analysis -<br \/>High-resolution material analysis in the nanometer range<\/h2>\n<p>In the encontec test laboratory, we examine surfaces, microstructures and fracture mechanisms using state-of-the-art scanning electron microscopy (SEM) and precise EDX element analysis. Our analyses provide clear, reliable results for quality assurance, damage analysis and material development. <\/p>\n<p>&nbsp;<\/p>\n<h2>Areas of application for SEM and EDX analysis<\/h2>\n<h3>Materials science<\/h3>\n<ul style=\"margin-left: 20px;\">\n<li>High-resolution examination of surfaces, fracture surfaces and cross-sections<\/li>\n<li>Analysis of microstructures, microstructures and material transitions<\/li>\n<li>Evaluation of layers, coatings and particles<\/li>\n<\/ul>\n<h3>Damage analysis<\/h3>\n<ul style=\"margin-left: 20px;\">\n<li>Identification of causes of damage using SEM + EDX<\/li>\n<li>Chemical analysis of inclusions, particles, corrosion residues<\/li>\n<li>Fractographic evaluation for the reconstruction of fracture mechanisms<\/li>\n<\/ul>\n<h3>Cathodoluminescence (CL detector)<\/h3>\n<ul style=\"margin-left: 20px;\">\n<li>Analysis of luminescent properties under electron bombardment<\/li>\n<li>Visualization of defects, zoning, phases and crystal growth<\/li>\n<li>Ideal for ceramics, semiconductors, minerals, glasses and functional materials<\/li>\n<\/ul>\n<p>&nbsp;<\/p>\n<h2>Your advantages at a glance<\/h2>\n<h3>Highest resolution<\/h3>\n<p>Representation of the finest structures down to the nanometer range.<\/p>\n<h3>Excellent depth of field<\/h3>\n<p>Clearly recognizable details even at very high magnifications.<\/p>\n<h3>Maximum variety of materials<\/h3>\n<p>Analysis of almost all materials: metals, ceramics, plastics (inorganic components), glass, powders, particles, adhesions and more.<\/p>\n<p>&nbsp;<\/p>\n<h2>Our SEM and EDX technologies<\/h2>\n<h3>Scanning electron microscopy (SEM)<\/h3>\n<ul style=\"margin-left: 20px;\">\n<li>Scanning the surface with a focused electron beam<\/li>\n<li>Vivid, high-resolution images<\/li>\n<li>Representation of micro- and nanostructures<\/li>\n<\/ul>\n<p>&nbsp;<\/p>\n<h2>Detectors at a glance<\/h2>\n<h3>SE detector (secondary electrons)<\/h3>\n<ul style=\"margin-left: 20px;\">\n<li>High-resolution topography<\/li>\n<li>Ideal for morphology, roughness, fine structures<\/li>\n<\/ul>\n<h3>BSD detector (backscattered electrons)<\/h3>\n<ul style=\"margin-left: 20px;\">\n<li>Contrast by element weight<\/li>\n<li>Optimal for material distribution and phase analysis<\/li>\n<\/ul>\n<h3>CL detector (cathodoluminescence)<\/h3>\n<ul style=\"margin-left: 20px;\">\n<li>Visualization of defects, zoning, crystal growth<\/li>\n<li>Supplements REM\/EDX with electronic and structural information<\/li>\n<\/ul>\n<h3>EDX analytics<\/h3>\n<ul style=\"margin-left: 20px;\">\n<li>Element determination from boron or carbon<\/li>\n<li>Point, line and area analyses (spots, linescans, mappings)<\/li>\n<li>Qualitative and quantitative composition analysis<\/li>\n<\/ul>\n<p>&nbsp;<\/p>\n<h2>Typical areas of application<\/h2>\n<ul style=\"margin-left: 20px;\">\n<li>Fracture surface investigations &amp; fractography<\/li>\n<li>Analysis of surface topography, roughness and morphology<\/li>\n<li>Detection of microdefects: Cracks, pores, inclusions<\/li>\n<li>Phase and material distribution analyses<\/li>\n<li>Characterization of layers and coatings<\/li>\n<li>Layer thickness measurements &amp; cross-section analyses<\/li>\n<li>Powder and particle analysis (incl. nano-powder)<\/li>\n<li>Chemical analysis of impurities, corrosion products, residues<\/li>\n<li>Defect and inhomogeneity analyses in functional materials<\/li>\n<li>Investigation of crystal growth, zoning and stresses<\/li>\n<\/ul>\n<p>&nbsp;<\/p>\n<h2>Why encontec?<\/h2>\n<h3>Accredited test laboratory<\/h3>\n<p>Certified quality according to DIN EN ISO\/IEC 17025.<\/p>\n<h3>Experienced materials laboratory team<\/h3>\n<p>Many years of expertise in SEM and EDX analysis - from routine tests to complex damage cases.<\/p>\n<h3>Modern equipment<\/h3>\n<ul style=\"margin-left: 20px;\">\n<li>ZEISS EVO MA 25<\/li>\n<li>SE, BSE and CL detectors<\/li>\n<li>Bruker XFlash EDX system<\/li>\n<\/ul>\n<h3>Industry-related analyses<\/h3>\n<p>For product optimization, damage analysis and quality control.<\/p>\n<h2>encontec -<br \/>Your partner for high-resolution SEM and EDX analysis<\/h2>\n<p>Precise, reproducible and metrologically reliable - for safe technical decisions.<\/p>\n<\/div>\n<\/div><\/div><\/div><\/div><\/div><div id=\"pg-13193-4\"  class=\"panel-grid panel-has-style\" ><div class=\"default-space container no-space-top default-space-bottom  panel-row-style panel-row-style-for-13193-4\" ><div id=\"pgc-13193-4-0\"  class=\"panel-grid-cell\" ><div id=\"panel-13193-4-0-0\" class=\"so-panel widget widget_sow-button panel-first-child panel-last-child\" data-index=\"6\" ><div class=\"no panel-widget-style panel-widget-style-for-13193-4-0-0\" ><div\n\t\t\t\n\t\t\tclass=\"so-widget-sow-button so-widget-sow-button-flat-b010da5f3242-13193\"\n\t\t\t\n\t\t><div class=\"ow-button-base ow-button-align-left\"\n>\n\t\t\t<a\n\t\t\t\t\thref=\"https:\/\/www.encontec.de\/kontakt\/\"\n\t\t\t\t\tclass=\"sowb-button ow-icon-placement-left ow-button-hover\" \t>\n\t\t<span>\n\t\t\t\n\t\t\tYour request\t\t<\/span>\n\t\t\t<\/a>\n\t<\/div>\n<\/div><\/div><\/div><\/div><\/div><\/div><\/div>","protected":false},"excerpt":{"rendered":"<p>Failure analysis &#8211; material characterization and quality control Scanning electron microscopy (SEM) enables extremely high-resolution images of surfaces, microstructures and fracture mechanisms. In combination with energy-dispersive X-ray spectroscopy (EDX), chemical elements from atomic number 5\/6 can also be reliably determined. SEM \/EDX analysis thus provides decisive information for quality assurance, damage analysis, material development and &hellip; <\/p>\n<p class=\"link-more\"><a href=\"https:\/\/www.encontec.de\/en\/accredited-test-laboratory\/scanning-electron-microscopy\/\" class=\"more-link\">Continue reading<span class=\"screen-reader-text\"> &#8220;Scanning electron microscopy&#8221;<\/span><\/a><\/p>\n","protected":false},"author":8,"featured_media":0,"parent":8254,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"inline_featured_image":false,"_monsterinsights_skip_tracking":false,"_monsterinsights_sitenote_active":false,"_monsterinsights_sitenote_note":"","_monsterinsights_sitenote_category":0,"_uf_show_specific_survey":0,"_uf_disable_surveys":false,"footnotes":""},"class_list":["post-13193","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/www.encontec.de\/en\/wp-json\/wp\/v2\/pages\/13193","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.encontec.de\/en\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.encontec.de\/en\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.encontec.de\/en\/wp-json\/wp\/v2\/users\/8"}],"replies":[{"embeddable":true,"href":"https:\/\/www.encontec.de\/en\/wp-json\/wp\/v2\/comments?post=13193"}],"version-history":[{"count":1,"href":"https:\/\/www.encontec.de\/en\/wp-json\/wp\/v2\/pages\/13193\/revisions"}],"predecessor-version":[{"id":13198,"href":"https:\/\/www.encontec.de\/en\/wp-json\/wp\/v2\/pages\/13193\/revisions\/13198"}],"up":[{"embeddable":true,"href":"https:\/\/www.encontec.de\/en\/wp-json\/wp\/v2\/pages\/8254"}],"wp:attachment":[{"href":"https:\/\/www.encontec.de\/en\/wp-json\/wp\/v2\/media?parent=13193"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}