{"id":13708,"date":"2026-05-21T16:38:13","date_gmt":"2026-05-21T14:38:13","guid":{"rendered":"https:\/\/www.encontec.de\/electronics-testing-laboratory-ipc-a-600-a-610\/"},"modified":"2026-06-22T16:04:16","modified_gmt":"2026-06-22T14:04:16","slug":"electronics-testing-laboratory-ipc-a-600-a-610","status":"publish","type":"page","link":"https:\/\/www.encontec.de\/en\/testing-laboratory\/electronics-testing-laboratory-ipc-a-600-a-610\/","title":{"rendered":"Electronics Testing Laboratory: IPC A 600 &#038; A 610"},"content":{"rendered":"<div id=\"pl-13708\"  class=\"panel-layout\" ><div id=\"pg-13708-0\"  class=\"panel-grid panel-has-style\" ><div class=\"header-slider panel-row-style panel-row-style-for-13708-0\" ><div id=\"pgc-13708-0-0\"  class=\"panel-grid-cell\" ><div id=\"panel-13708-0-0-0\" class=\"so-panel widget widget_sow-editor panel-first-child panel-last-child\" data-index=\"0\" ><div\n\t\t\t\n\t\t\tclass=\"so-widget-sow-editor so-widget-sow-editor-base\"\n\t\t\t\n\t\t>\n<div class=\"siteorigin-widget-tinymce textwidget\">\n\t<div id=\"metaslider-id-13827\" style=\"width: 100%;\" class=\"ml-slider-3-113-1 metaslider metaslider-flex metaslider-13827 ml-slider ms-theme-default nav-hidden\" role=\"region\" aria-label=\"Pr\u00fcflabor Elektronikpr\u00fcfung IPC Head EN\" data-height=\"965\" data-width=\"1920\">\n    <div id=\"metaslider_container_13827\">\n        <div id=\"metaslider_13827\">\n            <ul class='slides'>\n                <li style=\"display: block; width: 100%;\" class=\"slide-13829 ms-image \" aria-roledescription=\"slide\" data-date=\"2026-06-22 16:02:47\" data-filename=\"1.6_Leiterplattenpruefung-header.webp\" data-slide-type=\"image\"><img loading=\"lazy\" decoding=\"async\" src=\"https:\/\/www.encontec.de\/wp-content\/uploads\/2026\/05\/1.6_Leiterplattenpruefung-header.webp\" height=\"965\" width=\"1920\" alt=\"\" class=\"slider-13827 slide-13829 msDefaultImage\" title=\"1.6_Leiterplattenpr\u00fcfung-header\" \/><div class=\"caption-wrap\"><div class=\"caption\"><div class=\"caption-inner\"> <div class=\"header-slider-text\"> <p class=\"slidergross\">Electronics &amp; IPC Visual Inspection<\/p> <p class=\"slidernormal\">Cross-sections, IPC visual inspection, whiskers, microscopy &amp; more<\/p> <\/div> <\/div><\/div><\/div><\/li>\n            <\/ul>\n        <\/div>\n        \n    <\/div>\n<\/div>\n<\/div>\n<\/div><\/div><\/div><\/div><\/div><div id=\"pg-13708-1\"  class=\"panel-grid panel-has-style\" ><div class=\"default-space-big container panel-row-style panel-row-style-for-13708-1\" ><div id=\"pgc-13708-1-0\"  class=\"panel-grid-cell\" ><div id=\"panel-13708-1-0-0\" class=\"so-panel widget widget_sow-editor panel-first-child panel-last-child\" data-index=\"1\" ><div class=\"seo-text panel-widget-style panel-widget-style-for-13708-1-0-0\" ><div\n\t\t\t\n\t\t\tclass=\"so-widget-sow-editor so-widget-sow-editor-base\"\n\t\t\t\n\t\t>\n<div class=\"siteorigin-widget-tinymce textwidget\">\n\t<h1>Test Laboratory: Electronic Testing & Visual Inspection (IPC A 600 & A 610)<\/h1>\n<p>As a testing laboratory for electronic and visual inspections in accordance with IPC-A-600 and IPC-A-610, we analyze <strong>electronic assemblies, solder joints, and printed circuit boards<\/strong> according to IPC standards. Ideal for quality assurance, reliability, and complaint handling. By conducting electronic and visual inspections in accordance with the IPC-A-600 (printed circuit boards) and IPC-A-610 (electronic assemblies) guidelines, we evaluate manufacturing quality, solder joints, and defects. Whether for quality assurance, incoming goods inspection, or damage analysis, the inspections are typically performed visually using <a style=\"text-decoration: underline;\" href=\"https:\/\/www.encontec.de\/en\/testing-laboratory-for-surface-analysis-microscopy\/\">microscopy<\/a>, X-ray inspection (for solder joints), or supplementary micrographs. Please also see our Microscopy section.     <\/p>\n<\/div>\n<\/div><\/div><\/div><\/div><\/div><\/div><div id=\"pg-13708-2\"  class=\"panel-grid panel-has-style\" ><div class=\"anwendungen-wrap panel-row-style panel-row-style-for-13708-2\" id=\"Schadensanalyse\" ><div id=\"pgc-13708-2-0\"  class=\"panel-grid-cell\" ><div id=\"panel-13708-2-0-0\" class=\"so-panel widget widget_sow-editor panel-first-child panel-last-child\" data-index=\"2\" ><div class=\"image-wrap panel-widget-style panel-widget-style-for-13708-2-0-0\" ><div\n\t\t\t\n\t\t\tclass=\"so-widget-sow-editor so-widget-sow-editor-base\"\n\t\t\t\n\t\t>\n<div class=\"siteorigin-widget-tinymce textwidget\">\n\t<p><img decoding=\"async\" class=\"alignnone\" src=\"\/wp-content\/uploads\/2024\/12\/Schlifferstellung-e1709800713345.webp\" alt=\"\"><\/p>\n<\/div>\n<\/div><\/div><\/div><\/div><div id=\"pgc-13708-2-1\"  class=\"panel-grid-cell\" ><div id=\"panel-13708-2-1-0\" class=\"so-panel widget widget_sow-editor panel-first-child panel-last-child\" data-index=\"3\" ><div class=\"text-wrap panel-widget-style panel-widget-style-for-13708-2-1-0\" ><div\n\t\t\t\n\t\t\tclass=\"so-widget-sow-editor so-widget-sow-editor-base\"\n\t\t\t\n\t\t>\n<div class=\"siteorigin-widget-tinymce textwidget\">\n\t<div class=\"text-wrap-inner\">\n<h2 class=\"p1\">Test Laboratory: Sample Preparation<\/h2>\n<p>Our expertise includes creating high-precision cross-sections of electronic components and accurately assessing their connection to the printed circuit board, as well as creating cross-sections of any other components. We conduct a thorough analysis of cracks, crack patterns, and pores in solder joints to ensure that your electronic assemblies are free of defects. With our accredited in-house method for measuring cracks in solder joints, we offer you a professional and reliable standard for the quality control of your components.  <\/p>\n<p><a class=\"btn btn-anwendungen\" href=\"https:\/\/www.encontec.de\/en\/electronics-testing-laboratory-ipc-a-600-a-610\/test-laboratory-cross-sections-of-electronic-assemblies\/\">More<\/a><\/p>\n<\/div>\n<\/div>\n<\/div><\/div><\/div><\/div><\/div><\/div><div id=\"pg-13708-3\"  class=\"panel-grid panel-has-style\" ><div class=\"anwendungen-wrap anwendungen-wrap-reverse panel-row-style panel-row-style-for-13708-3\" id=\"Materialanalyse\" ><div id=\"pgc-13708-3-0\"  class=\"panel-grid-cell\" ><div id=\"panel-13708-3-0-0\" class=\"so-panel widget widget_sow-editor panel-first-child panel-last-child\" data-index=\"4\" ><div class=\"text-wrap panel-widget-style panel-widget-style-for-13708-3-0-0\" ><div\n\t\t\t\n\t\t\tclass=\"so-widget-sow-editor so-widget-sow-editor-base\"\n\t\t\t\n\t\t>\n<div class=\"siteorigin-widget-tinymce textwidget\">\n\t<div class=\"text-wrap-inner\">\n<h2 class=\"p1\">TEST LABORATORY IPC VISUAL INSPECTION<\/h2>\n<p>We specialize in the visual analysis of electronic components, assemblies, and printed circuit boards following product testing or in the event of damage. Drawing on our many years of experience and expertise, we perform visual inspections in accordance with the IPC-A610 and IPC-A600 standards. In addition, we provide analyses in accordance with our accredited in-house procedure or tailor our services to your specific needs. Using state-of-the-art technologies and a trained eye, we ensure that your components and assemblies meet the highest quality standards.   <\/p>\n<p><a class=\"btn btn-anwendungen\" href=\"https:\/\/www.encontec.de\/en\/electronics-testing-laboratory-ipc-a-600-a-610\/test-laboratory-visual-inspection-according-to-ipc-a-600-a-610\/\">More<\/a><\/p>\n<\/div>\n<\/div>\n<\/div><\/div><\/div><\/div><div id=\"pgc-13708-3-1\"  class=\"panel-grid-cell\" ><div id=\"panel-13708-3-1-0\" class=\"so-panel widget widget_sow-editor panel-first-child panel-last-child\" data-index=\"5\" ><div class=\"image-wrap panel-widget-style panel-widget-style-for-13708-3-1-0\" ><div\n\t\t\t\n\t\t\tclass=\"so-widget-sow-editor so-widget-sow-editor-base\"\n\t\t\t\n\t\t>\n<div class=\"siteorigin-widget-tinymce textwidget\">\n\t<p><img decoding=\"async\" class=\"alignnone\" src=\"\/wp-content\/uploads\/2024\/12\/Sichtpruefung_neu-1980x1318-1.webp\" alt=\"\"><\/p>\n<\/div>\n<\/div><\/div><\/div><\/div><\/div><\/div><div id=\"pg-13708-4\"  class=\"panel-grid panel-has-style\" ><div class=\"anwendungen-wrap panel-row-style panel-row-style-for-13708-4\" id=\"Haertepruefung\" ><div id=\"pgc-13708-4-0\"  class=\"panel-grid-cell\" ><div id=\"panel-13708-4-0-0\" class=\"so-panel widget widget_sow-editor panel-first-child panel-last-child\" data-index=\"6\" ><div class=\"image-wrap panel-widget-style panel-widget-style-for-13708-4-0-0\" ><div\n\t\t\t\n\t\t\tclass=\"so-widget-sow-editor so-widget-sow-editor-base\"\n\t\t\t\n\t\t>\n<div class=\"siteorigin-widget-tinymce textwidget\">\n\t<p><img decoding=\"async\" class=\"alignnone\" src=\"\/wp-content\/uploads\/2024\/12\/whiskeranalyse.webp\" alt=\"\"><\/p>\n<\/div>\n<\/div><\/div><\/div><\/div><div id=\"pgc-13708-4-1\"  class=\"panel-grid-cell\" ><div id=\"panel-13708-4-1-0\" class=\"so-panel widget widget_sow-editor panel-first-child panel-last-child\" data-index=\"7\" ><div class=\"text-wrap panel-widget-style panel-widget-style-for-13708-4-1-0\" ><div\n\t\t\t\n\t\t\tclass=\"so-widget-sow-editor so-widget-sow-editor-base\"\n\t\t\t\n\t\t>\n<div class=\"siteorigin-widget-tinymce textwidget\">\n\t<div class=\"text-wrap-inner\">\n<h2 class=\"p1\">WHISKER ANALYSIS TEST LABORATORY<\/h2>\n<p>Whiskers that grow in an electrical circuit or a connection point can cause short circuits, which may lead to malfunctions in electrical products.<br \/>\nThe analysis and prevention of whisker growth are therefore crucial to the safety and reliability of electrical products. We have in-depth expertise in whisker analysis. Using our state-of-the-art laboratory equipment, we examine your components and determine the presence, length, and location of whiskers.  <\/p>\n<p><a class=\"btn btn-anwendungen\" href=\"https:\/\/www.encontec.de\/en\/electronics-testing-laboratory-ipc-a-600-a-610\/test-laboratory-whisker-analysis\/\">More<\/a><\/p>\n<\/div>\n<\/div>\n<\/div><\/div><\/div><\/div><\/div><\/div><\/div>","protected":false},"excerpt":{"rendered":"<p>Test Laboratory: Electronic Testing &#038; Visual Inspection (IPC A 600 &#038; A 610) As a testing laboratory for electronic and visual inspections in accordance with IPC-A-600 and IPC-A-610, we analyze electronic assemblies, solder joints, and printed circuit boards according to IPC standards. Ideal for quality assurance, reliability, and complaint handling. By conducting electronic and visual &hellip; <\/p>\n<p class=\"link-more\"><a href=\"https:\/\/www.encontec.de\/en\/testing-laboratory\/electronics-testing-laboratory-ipc-a-600-a-610\/\" class=\"more-link\">Continue reading<span class=\"screen-reader-text\"> &#8220;Electronics Testing Laboratory: IPC A 600 &#038; A 610&#8221;<\/span><\/a><\/p>\n","protected":false},"author":11,"featured_media":0,"parent":13750,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"inline_featured_image":false,"_monsterinsights_skip_tracking":false,"_uf_show_specific_survey":0,"_uf_disable_surveys":false,"footnotes":""},"class_list":["post-13708","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/www.encontec.de\/en\/wp-json\/wp\/v2\/pages\/13708","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.encontec.de\/en\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.encontec.de\/en\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.encontec.de\/en\/wp-json\/wp\/v2\/users\/11"}],"replies":[{"embeddable":true,"href":"https:\/\/www.encontec.de\/en\/wp-json\/wp\/v2\/comments?post=13708"}],"version-history":[{"count":3,"href":"https:\/\/www.encontec.de\/en\/wp-json\/wp\/v2\/pages\/13708\/revisions"}],"predecessor-version":[{"id":13831,"href":"https:\/\/www.encontec.de\/en\/wp-json\/wp\/v2\/pages\/13708\/revisions\/13831"}],"up":[{"embeddable":true,"href":"https:\/\/www.encontec.de\/en\/wp-json\/wp\/v2\/pages\/13750"}],"wp:attachment":[{"href":"https:\/\/www.encontec.de\/en\/wp-json\/wp\/v2\/media?parent=13708"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}