{"id":13743,"date":"2026-05-21T15:27:23","date_gmt":"2026-05-21T13:27:23","guid":{"rendered":"https:\/\/www.encontec.de\/testing-laboratory-for-surface-analysis-microscopy\/scanning-electron-microscopy-testing-laboratory\/"},"modified":"2026-06-23T10:35:39","modified_gmt":"2026-06-23T08:35:39","slug":"scanning-electron-microscopy-testing-laboratory","status":"publish","type":"page","link":"https:\/\/www.encontec.de\/en\/testing-laboratory\/testing-laboratory-for-surface-analysis-microscopy\/scanning-electron-microscopy-testing-laboratory\/","title":{"rendered":"Scanning Electron Microscopy Testing Laboratory"},"content":{"rendered":"<div id=\"pl-13743\"  class=\"panel-layout\" ><div id=\"pg-13743-0\"  class=\"panel-grid panel-has-style\" ><div class=\"header-slider panel-row-style panel-row-style-for-13743-0\" ><div id=\"pgc-13743-0-0\"  class=\"panel-grid-cell\" ><div id=\"panel-13743-0-0-0\" class=\"so-panel widget widget_sow-editor panel-first-child panel-last-child\" data-index=\"0\" ><div\n\t\t\t\n\t\t\tclass=\"so-widget-sow-editor so-widget-sow-editor-base\"\n\t\t\t\n\t\t>\n<div class=\"siteorigin-widget-tinymce textwidget\">\n\t<div id=\"metaslider-id-13811\" style=\"width: 100%;\" class=\"ml-slider-3-113-1 metaslider metaslider-flex metaslider-13811 ml-slider ms-theme-default nav-hidden\" role=\"region\" aria-label=\"Pr\u00fcflabor Rasterelektronen-Mikroskopie Head EN\" data-height=\"965\" data-width=\"1920\">\n    <div id=\"metaslider_container_13811\">\n        <div id=\"metaslider_13811\">\n            <ul class='slides'>\n                <li style=\"display: block; width: 100%;\" class=\"slide-13813 ms-image \" aria-roledescription=\"slide\" data-date=\"2026-06-22 15:50:47\" data-filename=\"rem-1920x965-1.webp\" data-slide-type=\"image\"><img loading=\"lazy\" decoding=\"async\" src=\"https:\/\/www.encontec.de\/wp-content\/uploads\/2026\/02\/rem-1920x965-1.webp\" height=\"965\" width=\"1920\" alt=\"\" class=\"slider-13811 slide-13813 msDefaultImage\" title=\"rem-1920x965\" \/><div class=\"caption-wrap\"><div class=\"caption\"><div class=\"caption-inner\"> <div class=\"header-slider-text\"> <p class=\"slidergross\">Scanning electron microscopy (SEM)<\/p> <p class=\"slidernormal\">High-resolution material analysis at the nanometre scale<\/p> <\/div> <\/div><\/div><\/div><\/li>\n            <\/ul>\n        <\/div>\n        \n    <\/div>\n<\/div>\n<\/div>\n<\/div><\/div><\/div><\/div><\/div><div id=\"pg-13743-1\"  class=\"panel-grid panel-has-style\" ><div class=\"default-space panel-row-style panel-row-style-for-13743-1\" ><div id=\"pgc-13743-1-0\"  class=\"panel-grid-cell\" ><div id=\"panel-13743-1-0-0\" class=\"so-panel widget widget_sow-editor panel-first-child panel-last-child\" data-index=\"1\" ><div class=\"seo-text panel-widget-style panel-widget-style-for-13743-1-0-0\" ><div\n\t\t\t\n\t\t\tclass=\"so-widget-sow-editor so-widget-sow-editor-base\"\n\t\t\t\n\t\t>\n<div class=\"siteorigin-widget-tinymce textwidget\">\n\t<h1>Scanning Electron Microscopy (SEM) Testing Laboratory<\/h1>\n<p>Using scanning electron microscopy, we analyze surfaces, microstructures, and particles in the submicrometer range. The SEM provides high-resolution, three-dimensional images and enables detailed examination of cracks, layer systems, corrosion phenomena, particles, and microstructures. When <a href=\"https:\/\/www.encontec.de\/en\/testing-laboratory-edx-analysis\/\" style=\"text-decoration: underline;\">combined with EDX<\/a>, you receive precise information about morphology and chemical composition. The CL detector can be used to identify fluorescent plastic layers or cracks. Fluorescent minerals can also be examined.    <\/p>\n<\/div>\n<\/div><\/div><\/div><\/div><\/div><\/div><div id=\"pg-13743-2\"  class=\"panel-grid panel-has-style\" ><div class=\"anwendungen-wrap anwendungen-wrap-reverse panel-row-style panel-row-style-for-13743-2\" ><div id=\"pgc-13743-2-0\"  class=\"panel-grid-cell\" ><div id=\"panel-13743-2-0-0\" class=\"so-panel widget widget_sow-editor panel-first-child panel-last-child\" data-index=\"2\" ><div class=\"text-wrap normal-list panel-widget-style panel-widget-style-for-13743-2-0-0\" ><div\n\t\t\t\n\t\t\tclass=\"so-widget-sow-editor so-widget-sow-editor-base\"\n\t\t\t\n\t\t>\n<div class=\"siteorigin-widget-tinymce textwidget\">\n\t<div class=\"text-wrap-inner\">\n<h3 style=\"color: #ffffff;\">BENEFITS OF SEM<\/h3>\n<ul>\n<li><strong>Highest resolution:<\/strong> Depiction of the finest structures down to the nanometer range. High-resolution images with a three-dimensional appearance.<\/li>\n<li><strong>Excellent depth of field:<\/strong> Clearly visible details even at very high magnifications.<\/li>\n<li><strong>Maximum material diversity:<\/strong> Analysis of virtually all materials: metals, ceramics, plastics (inorganic components), glass, powders, particles, deposits, and more.<\/li>\n<\/ul>\n<\/div>\n<\/div>\n<\/div><\/div><\/div><\/div><div id=\"pgc-13743-2-1\"  class=\"panel-grid-cell\" ><div id=\"panel-13743-2-1-0\" class=\"so-panel widget widget_sow-editor panel-first-child panel-last-child\" data-index=\"3\" ><div class=\"image-wrap panel-widget-style panel-widget-style-for-13743-2-1-0\" ><div\n\t\t\t\n\t\t\tclass=\"so-widget-sow-editor so-widget-sow-editor-base\"\n\t\t\t\n\t\t>\n<div class=\"siteorigin-widget-tinymce textwidget\">\n\t<p><img loading=\"lazy\" decoding=\"async\" class=\"alignnone size-full wp-image-12823\" src=\"https:\/\/www.encontec.de\/wp-content\/uploads\/2026\/02\/rem-971x520-1.webp\" alt=\"\" width=\"971\" height=\"520\" srcset=\"https:\/\/www.encontec.de\/wp-content\/uploads\/2026\/02\/rem-971x520-1.webp 971w, https:\/\/www.encontec.de\/wp-content\/uploads\/2026\/02\/rem-971x520-1-300x161.webp 300w, https:\/\/www.encontec.de\/wp-content\/uploads\/2026\/02\/rem-971x520-1-768x411.webp 768w\" sizes=\"auto, (max-width: 767px) 89vw, (max-width: 1000px) 54vw, (max-width: 1071px) 543px, 580px\" \/><\/p>\n<\/div>\n<\/div><\/div><\/div><\/div><\/div><\/div><div id=\"pg-13743-3\"  class=\"panel-grid panel-has-style\" ><div class=\"default-space container space-bottom  panel-row-style panel-row-style-for-13743-3\" ><div id=\"pgc-13743-3-0\"  class=\"panel-grid-cell\" ><div id=\"panel-13743-3-0-0\" class=\"so-panel widget widget_sow-editor panel-first-child panel-last-child\" data-index=\"4\" ><div\n\t\t\t\n\t\t\tclass=\"so-widget-sow-editor so-widget-sow-editor-base\"\n\t\t\t\n\t\t>\n<div class=\"siteorigin-widget-tinymce textwidget\">\n\t<h2>Typical use cases:<\/h2>\n<p>&nbsp;<\/p>\n<ul style=\"margin-left: 20px;\">\n<li>Analysis of Cracks, Fracture Surfaces, and Delaminations<\/li>\n<li>Analysis of Particles, Contaminants, and Foreign Materials<\/li>\n<li>Evaluation of Layered Structures, Interfaces, and Surface Structures<\/li>\n<li>Characterization of Corrosion, Wear, and Material Changes<\/li>\n<li>Support for damage analyses and quality assessments<\/li>\n<\/ul>\n<p>&nbsp;<\/p>\n<h2>Scope of Services:<\/h2>\n<ul style=\"margin-left: 20px;\">\n<li>High-resolution SEM imaging in the sub-micrometer range<\/li>\n<li>Imaging of Surfaces, Microstructures, and Particles<\/li>\n<li>Combination with EDX elemental analysis, comparative images, and reference analyses<\/li>\n<li>Documentation of all relevant findings<\/li>\n<\/ul>\n<p>&nbsp;<\/p>\n<h2>Result:<\/h2>\n<ul style=\"margin-left: 20px;\">\n<li>High-resolution SEM images with clear visualization of microstructures<\/li>\n<li>Identification of defects, particles, or material deviations<\/li>\n<li>Comprehensive Documentation of Findings<\/li>\n<li>Recommendations for Development, Manufacturing, or Failure Analysis<\/li>\n<\/ul>\n<p>&nbsp;<\/p>\n<h2>An overview of the detectors in our SEM:<\/h2>\n<h3>SE detector (secondary electrons)<\/h3>\n<ul style=\"margin-left: 20px;\">\n<li>High-resolution topography<\/li>\n<li>Ideal for morphology, roughness, fine structures<\/li>\n<\/ul>\n<h3>BSD detector (backscattered electrons)<\/h3>\n<ul style=\"margin-left: 20px;\">\n<li>Contrast by element weight<\/li>\n<li>Optimal for material distribution and phase analysis<\/li>\n<\/ul>\n<h3>CL detector (cathodoluminescence)<\/h3>\n<ul style=\"margin-left: 20px;\">\n<li>Visualization of defects, zoning, crystal growth<\/li>\n<li>Supplements SEM\/EDX with electronic and structural information<\/li>\n<\/ul>\n<\/div>\n<\/div><\/div><\/div><\/div><\/div><div id=\"pg-13743-4\"  class=\"panel-grid panel-has-style\" ><div class=\"default-space container no-space-top default-space-bottom  panel-row-style panel-row-style-for-13743-4\" ><div id=\"pgc-13743-4-0\"  class=\"panel-grid-cell\" ><div id=\"panel-13743-4-0-0\" class=\"so-panel widget widget_sow-button panel-first-child panel-last-child\" data-index=\"5\" ><div class=\"no panel-widget-style panel-widget-style-for-13743-4-0-0\" ><div\n\t\t\t\n\t\t\tclass=\"so-widget-sow-button so-widget-sow-button-flat-66466acb9e12-13743\"\n\t\t\t\n\t\t><div class=\"ow-button-base ow-button-align-center\"\n>\n\t\t\t<a\n\t\t\t\t\thref=\"https:\/\/www.encontec.de\/kontakt\/\"\n\t\t\t\t\tclass=\"sowb-button ow-icon-placement-left ow-button-hover\" \t>\n\t\t<span>\n\t\t\t\n\t\t\tTo the inquiry\t\t<\/span>\n\t\t\t<\/a>\n\t<\/div>\n<\/div><\/div><\/div><\/div><\/div><\/div><\/div>","protected":false},"excerpt":{"rendered":"<p>Scanning Electron Microscopy (SEM) Testing Laboratory Using scanning electron microscopy, we analyze surfaces, microstructures, and particles in the submicrometer range. The SEM provides high-resolution, three-dimensional images and enables detailed examination of cracks, layer systems, corrosion phenomena, particles, and microstructures. When combined with EDX, you receive precise information about morphology and chemical composition. The CL detector &hellip; <\/p>\n<p class=\"link-more\"><a href=\"https:\/\/www.encontec.de\/en\/testing-laboratory\/testing-laboratory-for-surface-analysis-microscopy\/scanning-electron-microscopy-testing-laboratory\/\" class=\"more-link\">Continue reading<span class=\"screen-reader-text\"> &#8220;Scanning Electron Microscopy Testing Laboratory&#8221;<\/span><\/a><\/p>\n","protected":false},"author":11,"featured_media":0,"parent":13739,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"inline_featured_image":false,"_monsterinsights_skip_tracking":false,"_uf_show_specific_survey":0,"_uf_disable_surveys":false,"footnotes":""},"class_list":["post-13743","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/www.encontec.de\/en\/wp-json\/wp\/v2\/pages\/13743","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.encontec.de\/en\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.encontec.de\/en\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.encontec.de\/en\/wp-json\/wp\/v2\/users\/11"}],"replies":[{"embeddable":true,"href":"https:\/\/www.encontec.de\/en\/wp-json\/wp\/v2\/comments?post=13743"}],"version-history":[{"count":3,"href":"https:\/\/www.encontec.de\/en\/wp-json\/wp\/v2\/pages\/13743\/revisions"}],"predecessor-version":[{"id":13892,"href":"https:\/\/www.encontec.de\/en\/wp-json\/wp\/v2\/pages\/13743\/revisions\/13892"}],"up":[{"embeddable":true,"href":"https:\/\/www.encontec.de\/en\/wp-json\/wp\/v2\/pages\/13739"}],"wp:attachment":[{"href":"https:\/\/www.encontec.de\/en\/wp-json\/wp\/v2\/media?parent=13743"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}