{"id":13745,"date":"2026-05-21T15:46:54","date_gmt":"2026-05-21T13:46:54","guid":{"rendered":"https:\/\/www.encontec.de\/testing-laboratory-for-surface-analysis-microscopy\/testing-laboratory-sem-edx-analysis\/"},"modified":"2026-06-22T15:55:33","modified_gmt":"2026-06-22T13:55:33","slug":"testing-laboratory-sem-edx-analysis","status":"publish","type":"page","link":"https:\/\/www.encontec.de\/en\/testing-laboratory\/testing-laboratory-for-surface-analysis-microscopy\/testing-laboratory-sem-edx-analysis\/","title":{"rendered":"Testing Laboratory: SEM &#038; EDX Analysis"},"content":{"rendered":"<div id=\"pl-13745\"  class=\"panel-layout\" ><div id=\"pg-13745-0\"  class=\"panel-grid panel-has-style\" ><div class=\"header-slider panel-row-style panel-row-style-for-13745-0\" ><div id=\"pgc-13745-0-0\"  class=\"panel-grid-cell\" ><div id=\"panel-13745-0-0-0\" class=\"so-panel widget widget_sow-editor panel-first-child panel-last-child\" data-index=\"0\" ><div\n\t\t\t\n\t\t\tclass=\"so-widget-sow-editor so-widget-sow-editor-base\"\n\t\t\t\n\t\t>\n<div class=\"siteorigin-widget-tinymce textwidget\">\n\t<div id=\"metaslider-id-13815\" style=\"width: 100%;\" class=\"ml-slider-3-113-1 metaslider metaslider-flex metaslider-13815 ml-slider ms-theme-default nav-hidden\" role=\"region\" aria-label=\"Pr\u00fcflabor REM- &amp;#038; EDX-Analyse Head EN\" data-height=\"965\" data-width=\"1920\">\n    <div id=\"metaslider_container_13815\">\n        <div id=\"metaslider_13815\">\n            <ul class='slides'>\n                <li style=\"display: block; width: 100%;\" class=\"slide-13817 ms-image \" aria-roledescription=\"slide\" data-date=\"2026-06-22 15:54:27\" data-filename=\"edxneu_2-1920x965.webp\" data-slide-type=\"image\"><img loading=\"lazy\" decoding=\"async\" src=\"https:\/\/www.encontec.de\/wp-content\/uploads\/2024\/12\/edxneu_2-1920x965.webp\" height=\"965\" width=\"1920\" alt=\"\" class=\"slider-13815 slide-13817 msDefaultImage\" title=\"edxneu_2\" \/><div class=\"caption-wrap\"><div class=\"caption\"><div class=\"caption-inner\"> <div class=\"header-slider-text\"> <p class=\"slidergross\">EDX &amp; SEM Analysis<\/p> <\/div> <\/div><\/div><\/div><\/li>\n            <\/ul>\n        <\/div>\n        \n    <\/div>\n<\/div>\n<\/div>\n<\/div><\/div><\/div><\/div><\/div><div id=\"pg-13745-1\"  class=\"panel-grid panel-has-style\" ><div class=\"default-space panel-row-style panel-row-style-for-13745-1\" ><div id=\"pgc-13745-1-0\"  class=\"panel-grid-cell\" ><div id=\"panel-13745-1-0-0\" class=\"so-panel widget widget_sow-editor panel-first-child panel-last-child\" data-index=\"1\" ><div class=\"seo-text panel-widget-style panel-widget-style-for-13745-1-0-0\" ><div\n\t\t\t\n\t\t\tclass=\"so-widget-sow-editor so-widget-sow-editor-base\"\n\t\t\t\n\t\t>\n<div class=\"siteorigin-widget-tinymce textwidget\">\n\t<h1>Testing Laboratory: EDX & SEM Analysis<\/h1>\n<p>As a testing laboratory specializing in EDX and SEM analysis, we determine the chemical compositions of materials, particles, coatings, and more. Scanning electron microscopy (SEM) enables extremely high-resolution imaging of surfaces, microstructures, and fracture mechanisms. In combination with energy-dispersive X-ray spectroscopy (EDX), chemical elements with atomic numbers 5 and 6 and higher can also be reliably identified. As a result, SEM\/EDX analysis provides crucial information for quality assurance, failure analysis, materials development, and process optimization. As a testing laboratory accredited according to DIN EN ISO\/IEC 17025, encontec offers independent, reproducible, and industry-relevant analyses for mechanical engineering, medical technology, the food industry, electronics, the automotive sector, and many other industries.    <\/p>\n<\/div>\n<\/div><\/div><\/div><\/div><\/div><\/div><div id=\"pg-13745-2\"  class=\"panel-grid panel-has-style\" ><div class=\"anwendungen-wrap anwendungen-wrap-reverse panel-row-style panel-row-style-for-13745-2\" ><div id=\"pgc-13745-2-0\"  class=\"panel-grid-cell\" ><div id=\"panel-13745-2-0-0\" class=\"so-panel widget widget_sow-editor panel-first-child panel-last-child\" data-index=\"2\" ><div class=\"text-wrap normal-list panel-widget-style panel-widget-style-for-13745-2-0-0\" ><div\n\t\t\t\n\t\t\tclass=\"so-widget-sow-editor so-widget-sow-editor-base\"\n\t\t\t\n\t\t>\n<div class=\"siteorigin-widget-tinymce textwidget\">\n\t<div class=\"text-wrap-inner\">\n<h3 style=\"color: #ffffff;\">Our services:<\/h3>\n<ul>\n<li>High-resolution SEM imaging<\/li>\n<li>EDX element analysis (point, line, area)<\/li>\n<li>Fractography & damage analysis<\/li>\n<li>Analysis of cracks, pores, inclusions, particles<\/li>\n<li>Layer and cross-sectional examinations<\/li>\n<li>CL analytics for ceramics, semiconductors, minerals<\/li>\n<\/ul>\n<p>&nbsp;<\/p>\n<p><strong>Your advantage:<\/strong> Accredited, reproducible and industry-oriented material analyses - fast, precise and reliable.<\/p>\n<p><strong>Request SEM\/EDX analysis now - <br \/>We deliver results you can rely on.<\/strong><\/p>\n<\/div>\n<p><a class=\"btn btn-anwendungen\" href=\"https:\/\/www.encontec.de\/en\/contact\/\">Your request<\/a><\/p>\n<\/div>\n<\/div><\/div><\/div><\/div><div id=\"pgc-13745-2-1\"  class=\"panel-grid-cell\" ><div id=\"panel-13745-2-1-0\" class=\"so-panel widget widget_sow-editor panel-first-child panel-last-child\" data-index=\"3\" ><div class=\"image-wrap panel-widget-style panel-widget-style-for-13745-2-1-0\" ><div\n\t\t\t\n\t\t\tclass=\"so-widget-sow-editor so-widget-sow-editor-base\"\n\t\t\t\n\t\t>\n<div class=\"siteorigin-widget-tinymce textwidget\">\n\t<p><img loading=\"lazy\" decoding=\"async\" class=\"alignnone size-full wp-image-12823\" src=\"https:\/\/www.encontec.de\/wp-content\/uploads\/2026\/02\/rem-971x520-1.webp\" alt=\"\" width=\"971\" height=\"520\" srcset=\"https:\/\/www.encontec.de\/wp-content\/uploads\/2026\/02\/rem-971x520-1.webp 971w, https:\/\/www.encontec.de\/wp-content\/uploads\/2026\/02\/rem-971x520-1-300x161.webp 300w, https:\/\/www.encontec.de\/wp-content\/uploads\/2026\/02\/rem-971x520-1-768x411.webp 768w\" sizes=\"auto, (max-width: 767px) 89vw, (max-width: 1000px) 54vw, (max-width: 1071px) 543px, 580px\" \/><\/p>\n<\/div>\n<\/div><\/div><\/div><\/div><\/div><\/div><div id=\"pg-13745-3\"  class=\"panel-grid panel-has-style\" ><div class=\"default-space container space-bottom  panel-row-style panel-row-style-for-13745-3\" ><div id=\"pgc-13745-3-0\"  class=\"panel-grid-cell\" ><div id=\"panel-13745-3-0-0\" class=\"so-panel widget widget_sow-editor panel-first-child panel-last-child\" data-index=\"4\" ><div\n\t\t\t\n\t\t\tclass=\"so-widget-sow-editor so-widget-sow-editor-base\"\n\t\t\t\n\t\t>\n<div class=\"siteorigin-widget-tinymce textwidget\">\n\t<h2>Typical use cases:<\/h2>\n<p>&nbsp;<\/p>\n<ul style=\"margin-left: 20px;\">\n<li>Elemental Analysis of Particles<\/li>\n<li>Inclusions and Foreign Material<\/li>\n<li>Investigation of Layered Structures and Interfaces<\/li>\n<li>Identification of Material Contaminants<\/li>\n<li>Analysis of Element Distribution in Microstructures<\/li>\n<li>Material Identification with Comparison of a Material Certificate<\/li>\n<\/ul>\n<p>&nbsp;<\/p>\n<h2>Scope of Services:<\/h2>\n<ul style=\"margin-left: 20px;\">\n<li>Point Analyses for Element Identification<\/li>\n<li>Line and Area Mapping (Element Distribution)<\/li>\n<li>Combination with high-resolution SEM imaging<\/li>\n<li>Comparative measurements and reference analyses<\/li>\n<li>Technical Evaluation of the Results<\/li>\n<\/ul>\n<p>&nbsp;<\/p>\n<h2>Result:<\/h2>\n<ul style=\"margin-left: 20px;\">\n<li>Precise Elemental Composition (EDX)<\/li>\n<li>Comprehensive SEM\/EDX image documentation<\/li>\n<li>Clear Interpretation of the Findings<\/li>\n<li>Recommendations for Development, Manufacturing, or Failure Analysis<\/li>\n<\/ul>\n<p>&nbsp;<\/p>\n<h3>Experienced materials laboratory team<\/h3>\n<p>Many years of expertise in SEM and EDX analysis - from routine tests to complex damage cases.<\/p>\n<h3>Modern equipment<\/h3>\n<ul style=\"margin-left: 20px;\">\n<li>ZEISS EVO MA 25<\/li>\n<li>SE, BSE and CL detectors<\/li>\n<li>Bruker XFlash EDX system<\/li>\n<\/ul>\n<h3>Industry-related analyses<\/h3>\n<p>For product optimization, damage analysis and quality control.<\/p>\n<h2>encontec -<br \/>Your partner for high-resolution SEM and EDX analysis<\/h2>\n<p>Precise, reproducible and metrologically reliable - for safe technical decisions.<\/p>\n<\/div>\n<\/div><\/div><\/div><\/div><\/div><div id=\"pg-13745-4\"  class=\"panel-grid panel-has-style\" ><div class=\"default-space container no-space-top default-space-bottom  panel-row-style panel-row-style-for-13745-4\" ><div id=\"pgc-13745-4-0\"  class=\"panel-grid-cell\" ><div id=\"panel-13745-4-0-0\" class=\"so-panel widget widget_sow-button panel-first-child panel-last-child\" data-index=\"5\" ><div class=\"no panel-widget-style panel-widget-style-for-13745-4-0-0\" ><div\n\t\t\t\n\t\t\tclass=\"so-widget-sow-button so-widget-sow-button-flat-66466acb9e12-13745\"\n\t\t\t\n\t\t><div class=\"ow-button-base ow-button-align-center\"\n>\n\t\t\t<a\n\t\t\t\t\thref=\"https:\/\/www.encontec.de\/kontakt\/\"\n\t\t\t\t\tclass=\"sowb-button ow-icon-placement-left ow-button-hover\" \t>\n\t\t<span>\n\t\t\t\n\t\t\tTo the inquiry\t\t<\/span>\n\t\t\t<\/a>\n\t<\/div>\n<\/div><\/div><\/div><\/div><\/div><\/div><\/div>","protected":false},"excerpt":{"rendered":"<p>Testing Laboratory: EDX &#038; SEM Analysis As a testing laboratory specializing in EDX and SEM analysis, we determine the chemical compositions of materials, particles, coatings, and more. Scanning electron microscopy (SEM) enables extremely high-resolution imaging of surfaces, microstructures, and fracture mechanisms. In combination with energy-dispersive X-ray spectroscopy (EDX), chemical elements with atomic numbers 5 and &hellip; <\/p>\n<p class=\"link-more\"><a href=\"https:\/\/www.encontec.de\/en\/testing-laboratory\/testing-laboratory-for-surface-analysis-microscopy\/testing-laboratory-sem-edx-analysis\/\" class=\"more-link\">Continue reading<span class=\"screen-reader-text\"> &#8220;Testing Laboratory: SEM &#038; EDX Analysis&#8221;<\/span><\/a><\/p>\n","protected":false},"author":11,"featured_media":0,"parent":13739,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"inline_featured_image":false,"_monsterinsights_skip_tracking":false,"_uf_show_specific_survey":0,"_uf_disable_surveys":false,"footnotes":""},"class_list":["post-13745","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/www.encontec.de\/en\/wp-json\/wp\/v2\/pages\/13745","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.encontec.de\/en\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.encontec.de\/en\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.encontec.de\/en\/wp-json\/wp\/v2\/users\/11"}],"replies":[{"embeddable":true,"href":"https:\/\/www.encontec.de\/en\/wp-json\/wp\/v2\/comments?post=13745"}],"version-history":[{"count":1,"href":"https:\/\/www.encontec.de\/en\/wp-json\/wp\/v2\/pages\/13745\/revisions"}],"predecessor-version":[{"id":13818,"href":"https:\/\/www.encontec.de\/en\/wp-json\/wp\/v2\/pages\/13745\/revisions\/13818"}],"up":[{"embeddable":true,"href":"https:\/\/www.encontec.de\/en\/wp-json\/wp\/v2\/pages\/13739"}],"wp:attachment":[{"href":"https:\/\/www.encontec.de\/en\/wp-json\/wp\/v2\/media?parent=13745"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}